Oral Sessions (Day1, Day2, Day3)
Poster Presentations (Day1, Day2, Day3)
Oral Sessions
- Day 1, June 22（Wed.） 18:00-18:15 Room D (413 and 414)
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1D-O1-1800（1P-48） PDF
Development of a Laser Ablation-ICP-MS (LA-ICP-MS) system setup without using He carrier gas
ICP-mass spectrometry (ICP-MS) combined with laser ablation sampling technique (LA-ICP-MS) is one of the most sensitive and rapid analytical tool for major- to trace-elements in solid materials. With the conventional system, He carrier gas, rather than Ar gas was used because of both the smaller magnitude of elemental fractionation during the laser ablation and better transport efficiency of the laser induced sample particles into the ICP. Nevertheless this, introduction of He into the ICP ion source can cause lowering the plasma temperature, resulting in increase of the oxide ions (MO+). Moreover, because of limited commercial production of the He gas, use of He carrier gas can higher running cost, and thus, the LA-ICP-MS system setup without using the He carrier gas would be the potential demands from the community. The analysis without He gas can provide easier optimization procedure for the analysis. In this study, we focused on femtosecond laser, which generates smaller aerosols from the sample, and conducted basic experiments without using He carrier gas. We evaluated analytical sensitivity, repeatability, and the probability of producing polyatomic ions from glass reference material (NIST SRM 610) and zircon reference material (Plešovice zircon).