ランチョンセミナー
- 第3日 6月24日（金） 12:20～13:20 D会場（413，414）
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3D-L-1220 PDF
新製品 SELECT SERIES MRT: 次世代高質量分解能や高質量精度の四重極-飛行時間質量分析計(Q-Tof) -主な特徴とアプリケーション例-
We introduce the next generation Q-ToF built with state-of-the-art Multi Reflecting Time-of-Flight (MRT) technology. The system’s class-leading ToF resolution is achieved through the innovative use of multiple reflections of the ion beam. This approach increases the length of the flight path to 47m while maintaining a small instrument footprint. The ions are refocused as they progress to prevent dispersion and losses. As mass accuracy has a direct dependency on resolution and ion statistics, high-quality accurate mass data is delivered as standard without compromising scan speed.
While the MRT technology achieves superior resolution, state-of-the-art ion optics maintain sensitivity. This results in high resolution over a broad mass range and routine ppb mass accuracy, enabling highly detailed structural characterization enabling you to overcome the biggest scientific challenges.