日本質量分析学会 第70回質量分析総合討論会会

演題概要

特別講演

第1日 6月22日(水) 10:15~11:00 A会場(メインホール)

マイクロ結晶スポンジ法(MicroCS法):質量分析に迫る極微量X線分子構造解析

(東大院工)
o藤田誠

We have developed a new protocol for SCD analysis that does not require the crystallization of the sample. In the method (called crystalline sponge- or CS-method), tiny crystals of porous complexes (CSs) are soaked in the solution of a target, where the complexes can absorb and orient the target molecules in the pores. The subsequent crystallographic analysis clearly determines the absorbed guest structures along with the host frameworks. As the SCD analysis is carried out with only one tiny crystal, the required sample amount is of the nano-to-microgram order. By using micrometer-sized CSs and multi-data collection at synchrotron facilities (SP-ring 8 and KEK), the CS method can analyze trace amount samples even at below nano-gram scale. Micro Electron Diffraction (ED) analysis makes it possible to analyze trace samples on the femto- to pico-gram scale, comparable to MS sensitivity.