日本質量分析学会 第67回質量分析総合討論会

演題概要

ポスター発表

第1日 5月15日(水)  P会場(多目的ホール)

直交加速飛行時間型質量分析計に適したミクロンサイズの微細格子電極の製作

(島津)
o古橋治工藤朋也谷口純一出水秀明山崎寛奥村大輔

We have produced a fine grating having pitches of 100x1000 um, transmission of 70 %, and thickness of 2 mm. This grating having high aspect ratio is expected to be suitable for an extraction grid of orthogonal acceleration TOF-MS by the following reasons. 1) Divergence of ion trajectories due to lens effect can be suppressed by reducing the pitch of grating; this provides high sensitivity. 2) Ion loss on the grating can be reduced due to high transmission. 3) High extraction field can be practicable thanks to increased mechanical strength; this contributes to both high resolving power and high sensitivity. 4) Since deformation of the grating during ion ejection can be suppressed, the reproducibility of each ion ejection will be improved; this contributes to high mass accuracy. 5) Because the field penetration from the flight tube is suppressed, background ions during data collection will be removed. To evaluate the effectiveness experimentally, the grating was introduced into a new orthogonal acceleration TOF-MS, namely, Shimadzu LCMS-9030. The present grating was proven to contribute to high resolving power, high sensitivity, low background, and high mass accuracy of the TOF-MS.