日本質量分析学会 第66回質量分析総合討論会

Program

Oral Sessions

Day 2, May 16(Wed.) 15:40-16:00 Room C (Seiun 2)

Development of a Secondary Neutrals Mass Spectrometer with a laser post-ionization for sub-micron scale in-situ isotopic analysis

(1Osaka Univ., 2Osaka Univ. PRC, 3Osaka Univ., 4Hiroshima Univ.)
oYosuke Kawai1,2, Takahiro Matsuda1, Kohei Miya1, Toshinobu Hondo1, Jun Aoki2, Morio Ishihara1,2, Michisato Toyoda2, Ryosuke Nakamura3, Hikaru Yabuta4, Kentaro Terada1,2

Isotopic compositions in extraterrestrial materials provide us an important clue to decipher the origin and evolution of the solar system. To accomplish a sub-micron scale spatial resolution analysis, we have been developing a Secondary Neutrals Mass Spectrometer (SNMS) with a femtosecond laser, which post-ionizes neutrals sputtered by a focused ion beam. For the application to in-situ U-Pb chronology, terrestrial zircons were measured and it was confirmed that 100 ppm uranium could be detected from an area of 1 μm in diameter. The high spatial resolution allows the isotopic analysis of both major and trace elements in single presolar grains which provide information about stellar nucleosynthesis and galactic chemical evolution.