基盤セッション
第3日 6月12日（水） 14:33～14:51 D会場（中会議室202）
- 3D-O2-1433
多数のケンドリックマスディフェクトプロットからポリマーの特徴パターンを抽出するインフォマティクス技術
(1JEOL・ 2産総研機能化学)
o佐藤貴弥1・ 渡邊直美1・ 佐藤崇文1・ 新澤英之2・ 中村清香2・ 大石晃広2・ 萩原英昭2・ 佐藤浩昭2
MALDI-TOFMS, which can measure the polymer distribution in singly-charged ions, helps in the characterization of synthetic polymers. The combination of high-mass resolution MALDI-TOFMS and the Kendrick mass defect (KMD) method has improved the efficiency of the analysis of complex polymer mass spectra. However, there is still room for consideration of methods for comparing and classifying many complex mass spectra for purposes such as quality control. In this presentation, we investigated a data processing method that extracts characteristic patterns to make it easier to compare multiple KMD plots and whether it is possible to summarize and classify data by combining it with statistical analysis.