日本質量分析学会 第72回質量分析総合討論会
日程
2024年6月10日(月)~ 6月12日(水)
会場
つくば国際会議場 エポカルつくば(茨城県つくば市竹園2-20-3)
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演題概要

基盤セッション

第3日 6月12日(水) 14:51~15:09 C会場(中会議室201)

3C-O2-1451
PDF

Si微細加工基板の光励起ソフトイオン化における構造サイズ依存性

(1北大院総化2JEOL協働研3阪大リノ工作4阪大院理5北大電子研)
藤井優祐1古谷浩志3大須賀潤一2豊田岐聡4o松尾保孝5

The soft ionization technique by photoexcitation of nanofabricated microstructures on the surface of silicon substrates was investigated. Patterns of nanopillars with diameters ranging from 100 nm to 400 nm and heights of several hundred nm arrayed at pillar space varying from 100 nm to 400 nm were fabricated on a silicon substrate by electron beam lithography and dry etching techniques. Glycine solution was dropped onto the fabricated structures and the mass spectrum was measured by laser irradiation. As a result, protonated glycine was detected at lower laser intensities on the substrate with nanostructures compared to the flat surface of Si substrate. It is considered that the substrates with nanostructures have a high optical absorption, suggesting that efficient optical absorption accelerated ionization. There were also significant differences in the ion intensity detected depending on the structure size. In this report, the correlation between the fabricated structure size and soft ionization efficiency is discussed in more detail.