演題概要

オーラルセッション

第3日 5月20日(金) 17:05~17:20 C会場(星雲2)

二次イオン質量分析法および関連技術を用いたイメージング質量分析

(1京大院工2東北大多元研3JEOL)
o藤井麻樹子1宍戸理恵2佐藤貴弥3鈴木茂2松尾二郎1

Recently, Imaging Mass Spectrometry (IMS) has been widely performed for the analysis of synthetic polymers, functional organic devices and biological materials, because not only the spatial distribution of target molecules but also the structural information can be given by obtained mass images and mass spectra. There are some techniques used, such as Matrix-assisted laser desorption/ionization (MALDI) mass spectrometry, Desorption Electrospray Ionization (DESI) mass spectrometry and Secondary ion mass spectrometry (SIMS). In this study, the possibilities and limitations of IIMS with SIMS and the related techniques were investigated using some organic model samples.