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Poster Presentations
Day 1, June 10（Mon.） Room P1 (Multipurpose Hall)・Room P2 (Conference Room 101+102)
- 1P-12
Comparison of Feature Pattern Extraction for Multiple Polymer Samples Using Kendrick Mass Defect Plot and Mass Spectra
(1JEOL, 2AIST, 3Infocom)
oTakaya Satoh1, Naomi Watanabe1, Takafumi Sato1, Hideyuki Shinzawa2, Sayaka Nakamura2, Akihiro Oishi2, Hideaki Hagihara2, Hiroaki Sato2, Shigetoshi Yoshikawa3
MALDI-TOFMS, which can measure the polymer distribution in singly-charged ions, helps in the characterization of synthetic polymers. The combination of high-mass resolution MALDI-TOFMS and the Kendrick mass defect (KMD) method has improved the efficiency of the analysis of complex polymer mass spectra. However, there is still room for consideration of methods for comparing and classifying many complex mass spectra for purposes such as quality control. In this presentation, we compared statistical analysis results using KMD plots and mass spectra to extract characteristic patterns to simplify summarizing and classifying data.