Abstract

Poster Presentations

Day 2, May 18（Thu.）　　Room P (Multi-purpose Hall)

2P-49　　PDF

Development of a Secondary Neutrals Mass Spectrometer with a laser post-ionization for sub-micron scale in-situ isotopic analysis

(¹Osaka Univ., ²Osaka Univ., ³Osaka Univ., ⁴Hiroshima Univ.)
^oYosuke Kawai^1,2, Takahiro Matsuda¹, Kohei Miya¹, Toshinobu Hondo¹, Jun Aoki^1,2, Morio Ishihara^1,2, Michisato Toyoda^1,2, Ryosuke Nakanura³, Hikaru Yabuta⁴, Kentaro Terada^1,2

Isotopic compositions of various meteorites provide us an important clue to decipher the origin and evolution of the solar system. To accomplish a sub-micron scale resolution analysis (< 1 μm), we have been developing a Secondary Neutrals Mass Spectrometer (SNMS) with a high-power femto-second laser which post-ionizes neutrals sputtered by a focused ion beam. From the measurement of terrestrial zircons containing 100 ppm uranium toward the application to in-situ U-Pb chronology, U and oxidized U ions could be detected with a sputtered area of 1 μm in diameter. The high spatial resolution enabled to determine isotopic ratios of both major and trace elements in single SiC presolar grains.