The Mass Spectrometry society of Japan - The 68th Annual Conference on Mass Spectrometry, Japan
Japanese

Abstract

Table of contents

Timetable

Plenary Lectures

Oral Sessions (Day1, Day2, Day3)

Poster Presentations (Day1, Day2, Day3)

Workshops

Luncheon Seminars (Day1, Day2, Day3)

Poster Presentations

Day 2, May 12（Tue.）　　Poster (1008/09)

2P-25　　PDF

Study on the Full Product Ion Analysis of Multiply Charged Precursor Ions by Using a Reflectron Time-of-Flight Mass Spectrometer

(1Osaka City Univ., 2Osaka Pref. Univ.)
oKosei Kitagawa1, Akihiro Kitashoji1, Akimasa Fujihara2, Tomoyuki Yatsuhashi1

A multiply charged molecule ion expands the range of a mass window and is utilized as a precursor to provide rich product ion information; however, reflectron time-of-flight mass spectrometer has not been well applied to the product ion analysis of multiply charged precursor ions. In this study, we demonstrate that the product ions of multiply charged decafluorobiphenyl (C12F10) formed in intense laser fields can be identified. Measurements of the time-of-flight spectrum by changing the potential applied to the reflectron, combined with simulation of the ion trajectory, identified the species detected behind the reflectron as the neutral species and/or ions formed by the collisional charge transfer. Moreover, the product ions formed by the metastable ion dissociations of C12F102+ were identified.