The Mass Spectrometry society of Japan - The 68th Annual Conference on Mass Spectrometry, Japan
Japanese

Abstract

Table of contents

Timetable

Plenary Lectures

Oral Sessions (Day1, Day2, Day3)

Poster Presentations (Day1, Day2, Day3)

Workshops

Luncheon Seminars (Day1, Day2, Day3)

Oral Sessions

Day 1, May 11（Mon.）　15:30-15:50　Room B (1202)

1B-O2-1530　　PDF

Study on the production process of negative ions in negative ion source using Cs sputtering

(1RIKEN, 2Univ. Tokyo, 3Univ. Tokyo)
oYasuto Miyake1, Hiroyuki Matsuzaki2,3

Negative ion source using Cs sputtering is widely used in accelerator mass spectrometry (AMS). Nevertheless, the production process of negative ions is still not elucidated, and an attempt to establish a theoretical model that can predict the generated ions for practical applications. Estimation and control of the production process from sample condition enable us to increase ion beam current and suppress isobar interference, resulting in improvement of measurement efficiency and sensitivity. Laser photo-detachment (LPD) in AMS can apply only in the case if electron affinity (EA) of isobar nuclide is lower than that of the nuclide of interest. However, there are several nuclides which EA is higher than that of target nuclide in elemental form, but in the case of a molecular ion, its EA gets lower than EA of target nuclide. Therefore, LPD is available utilizing molecular ions. In this paper, we will introduce the recent study on the production process of negative ions of Cs sputter-negative ion source and discuss research plans and application to the LPD technique.