Symposium Sessions
Day 1, June 10（Wed.） 13:50-14:20 Room B (4F 411+412)
- 1B-S1-1350
Elucidation of ultrafast secondary-ion emission phenomena triggered by nanoscale energy deposition by energetic cluster ion impacts and its application to mass spectrometry
(UOsaka)
oKouichi Hirata
Impacts of clusters on a solid target can give rise to unique energy deposition processes in which multiple atoms in the same cluster simultaneously transfer their energy to a nanometer-scale region of the target surface. This results in a difference in impact-induced quantities per atom between impacts of a cluster ion and the corresponding monoatomic ion of the same element with the same velocity. One of the characteristics of cluster ion impacts is that the number of emitted secondary ions (SIs) per incident atom for a cluster ion impact is larger than that for the corresponding monoatomic ion of the same element with the same velocity and is generally enhanced with increasing number of constituent atoms in the cluster (cluster number n) for a given velocity and with increasing cluster impact energy for a given n. Therefore, the use of impacts of energetic cluster ions with large n, energetic large-cluster ions, is advantageous for enhancing the SI emission yield. In this talk, I present recent progresses and future prospects in elucidation of the ultrafast phenomena of intense SI emission triggered by nanoscale energy deposition by energetic cluster impacts and its application to highly sensitive and reproducible mass-spectroscopic analysis.