演題概要

ポスター発表

第2日　5月16日（火）　　P会場（ホワイエ，会議室1004-1007）

2P-56　　PDF

帯電液滴衝撃／二次イオン質量分析法による合成高分子／シリコン積層試料の分析

(¹山梨大・ ²ジョンズホプキンス大)
^o二宮啓¹・ 境悠治¹・ 窪田展幸¹・ Rankin-Turner, Stephanie^1,2・ 平岡賢三¹

Among various types of cluster secondary ion mass spectrometry (SIMS), electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) is unique due to its high ionization efficiency and non-selective atomic/molecular-level surface etching ability. In this study, EDI/SIMS was applied to synthetic polymers of polystyrene (PS) and poly(9,9-di-n-octylfluonyl-2,7diyl) (PFO) spin-coated on a silicon substrate.