ポスター発表
- 第2日 5月16日（火） P会場（ホワイエ，会議室1004-1007）
-
2P-24 PDF
GC/MS精密質量プロダクトイオンスペクトルによるフラグメントイオンの構造推定とデータベースへの応用
Advances in accurate mass measurement have made it easier to know the composition of molecular and fragment ions in GC/MS. However, it may be difficult to determine the structure of ions that may have multiple structures with the same composition. Therefore, when MS/MS measurements were performed using ions with the same composition but different structures as precursor ions, it was found that they could be distinguished to some extent, and it was found that this could help in understanding the structure of each ion. In addition, we have found that creating a database of MS/MS spectra can help us to understand the structure of molecules.