日本質量分析学会 第67回質量分析総合討論会

Abstract

Oral Sessions

Day 2, May 16(Thu.) 09:50-10:10 Room B (102)

High Spatial Resolution Imaging of Organic Material Surfaces by TOF-SIMS MS/MS

(ULVAC-PHI)
oShin-ichi Iida, Takuya Miyayama

Recently, we have developed TOF-SIMS instrument equipped with tandem mass spectrometry (MS/MS). In this presentation, we will introduce our new instrument and its imaging capability.