日本質量分析学会 第67回質量分析総合討論会

Abstract

Poster Presentations

Day 1, May 15(Wed.)  Room P (Multi-purpose Hall)

Production of Micron-Sized Fine Grating Suitable for Orthogonal Acceleration TOF-MS

(Shimadzu)
oOsamu Furuhashi, Tomoya Kudo, Junichi Taniguchi, Hideaki Izumi, Hiromu Yamasaki, Daisuke Okumura

We have produced a fine grating having pitches of 100x1000 um, transmission of 70 %, and thickness of 2 mm. This grating having high aspect ratio is expected to be suitable for an extraction grid of orthogonal acceleration TOF-MS by the following reasons. 1) Divergence of ion trajectories due to lens effect can be suppressed by reducing the pitch of grating; this provides high sensitivity. 2) Ion loss on the grating can be reduced due to high transmission. 3) High extraction field can be practicable thanks to increased mechanical strength; this contributes to both high resolving power and high sensitivity. 4) Since deformation of the grating during ion ejection can be suppressed, the reproducibility of each ion ejection will be improved; this contributes to high mass accuracy. 5) Because the field penetration from the flight tube is suppressed, background ions during data collection will be removed. To evaluate the effectiveness experimentally, the grating was introduced into a new orthogonal acceleration TOF-MS, namely, Shimadzu LCMS-9030. The present grating was proven to contribute to high resolving power, high sensitivity, low background, and high mass accuracy of the TOF-MS.