プログラム

ポスター発表

第1日　5月15日（火）　　ポスター会場

1P-38　　PDF

マッシブクラスターイオンビームを用いる二次イオン質量分析の評価

(¹山梨大工・ ²山梨大クリエネ研)
^o高木悠一郎¹・ 二宮啓¹・ 堀内直也¹・ Lee Chuin, Chen¹・ 平岡賢三²

Recently, massive cluster ion beams have been studied in order to improve the performance of secondary ion mass spectrometry. In this study, secondary ion spectra produced by Ar gas cluster ion and vacuum-type electrospray droplet ion (V-EDI) beams were measured for several organic compounds with a triple focus time-of-flight mass spectrometer. Secondary ion yields produced by the V-EDI beams were much higher than those produced by Ar gas cluster ion beams.