日本質量分析学会 第66回質量分析総合討論会

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ポスター発表

第1日 5月15日(火)  ポスター会場

最新GC/Q-TOF における低エネルギー電子イオン化(Low Energy EI)の効果について

(アジレント)
笠松隆志中村貞夫奥田昌弘o芹野武

70 eV electron ionization (EI) commonly used in GC / MS is a hard ionization and it is often difficult to detect molecular ions, therefore sometimes soft ionization is required for yielding the molecular ions. However, in order to perform soft ionization, replacing the ion source is required but it is difficult to perform measurement by soft ionization immediately after switching from 70eV EI analysis. In this study, Low Energy EI measurement was carried out using GC / MS with an ion source that was optimized for conventional energy (70eV) and Low Energy EI, and we examined the effect. This instrument can switch from 70 eV to Low Energy EI only by changing the data acquiring method, so it is very easy to perform Low Energy EI measurement.