Abstract

Oral Sessions

Day 3: Friday, May 20 10:20-10:40 Room B (Seiun 1)

Surface sensitiveness of silver deposition surface-assisted laser desorption/ionization imaging mass spectrometry.

(1JEOL, 2Kyoto Univ.)
oTakaya Satoh1, Hironobu Niimi1, Naoki Kikuchi1, Makiko Fujii2, Toshio Seki2, Jiro Matsuo2

The surface sensitiveness of silver deposition surface-assisted laser desorption/ionization imaging mass spectrometry was investigated. The probing depth was estimated to be 50 nm by observing mass images variations acquired from samples with different thicknesses of Irganox 1010 layers on Irganox 3114 layer.