Abstract

Poster Presentations

Day 1: Wednesday, May 18　　Poster Room（Icho）

1P-39　　PDF

Secondary ion yields produced by charged droplet and Ga ion beams

(¹Univ. Yamanashi, ²Univ. Yamanashi)
^oRyo Watanabe¹, Satoshi Ninomiya¹, Yuji Sakai², Lee Chuin Chen¹, Kenzo Hiraoka²

This study provides the yields of secondary ions produced by Ga ion and charged droplet beams with a time-of-flight secondary ion mass spectrometer.