Abstract

Poster Presentations

Day 1: Wednesday, May 18  Poster Room(Gekko)

Development and Applications of a Photoionization Ion Source for a GC/High Resolution-TOFMS system

(1JEOL, 2JEOL USA, 3JEOL EUROPE B.V., 4JEOL EUROPE SAS, 5University of Liège)
oMasaaki Ubukata1,2, Robert B. Cody2, A. John Dane2, Toshiyuki Kato1, Masahiro Ito1, Bram van der Meer3, Junichi Osuga4, Jean-François Focant5

Recently, we developed a photo ionization (PI) ion source as a 3rd soft ionization technique for a GC/high resolution time-of-flight mass spectrometer (GC/HR-TOFMS) system. PI is a soft ionization technique that provides good sensitivity and molecular ion information for compounds with ionization energies below the maximum practical photon energy (10.8 eV) of the deuterium lamp used in our current design. GC/PI MS and GCxGC/PI MS is particularly useful for the analysis of hydrocarbons and aromatic compounds and can be more sensitive than field ionization for certain applications. Because GC/HR-TOFMS can easily give exact mass information for all of the ions generated by photo ionization, target compound identification can be very selective and the identification of unknowns is facilitated.