Abstract

Oral Sessions

Day 3: Friday, May 16 16:35-16:55 Room A (Orbit Hall)

Current Progress in SIMS using Massive Cluster ion beams

(Kyoto Univ.)
oJiro Matsuo

Massive Ar cluster beams are quite useful as primary beam for SIMS, given their reduced surface damage and fragmented ion generation. We have recently successful in obtaining a fine focused massive cluster ion beam with the diameter of about 1
μm in spite of the large ion energy distribution.
Recent progress and future trend in this technique will be discussed together with upcoming equipment and possible applications.