3A-O2-1615 PDF
Depth profiling of organic thin film using laser desorption ionization
In recent years, the electrical devices composed of organic and inorganic materials such as organic light-emitting diodes and organic semiconductor devices have been widely used. There are various techniques for surface analysis such as a SEM/EDS, EPMA, XPS, TOF-SIMS and so on. However, the analytical techniques to obtain the molecular information on organic layers in electronic devices are limited. In this presentation, we will discuss about the possibility to apply the depth profiling using laser desorption/ionization time-of-flight mass spectrometer (LDI-TOFMS) as a novel tool for analyzing organic layers in electronic devices.