日本質量分析学会 第67回質量分析総合討論会

Abstract

Oral Sessions

Day 2, May 16(Thu.) 10:10-10:30 Room D (202)

Development of High-resolution Ion Trap Ion Mobility Measurement System and Observation of Nanomaterials

(Toho Univ.)
Yudai Hoshino, Fumiaki Uchiyama, Reona Miyamato, Yuya Ohishi, Ryo Sasaki, Takanori Nakayasu, oToshiki Sugai

Ion mobility together with mass spectrometry has been utilized to reveal novel structures of nanomaterials. However, the resolution is still not high enough to reveal details of their structures. We have been developing ion trap ion mobility measurement system with optical observation on particles with the sizes of several tens of m to nanomaterials with that of 5 nm by enhancing the sensitivity. Here we present newly developed system that realizes high-resolution IMS measurements on nanomaterials.