Program

Poster Presentations

Day 1, May 15（Tue.）　　Poster

1P-38　　PDF

Evaluation of Secondary Ion Mass Spectrometry Using Massive Cluster Ion Beams

(¹Univ. Yamanashi, ²Univ. Yamanashi)
^oYuichiro Takagi¹, Satoshi Ninomiya¹, Naoya Horiuchi¹, Chen Lee Chuin¹, Kenzou Hiraoka²

Recently, massive cluster ion beams have been studied in order to improve the performance of secondary ion mass spectrometry. In this study, secondary ion spectra produced by Ar gas cluster ion and vacuum-type electrospray droplet ion (V-EDI) beams were measured for several organic compounds with a triple focus time-of-flight mass spectrometer. Secondary ion yields produced by the V-EDI beams were much higher than those produced by Ar gas cluster ion beams.