Program

Poster Presentations

Day 1, May 15（Tue.）　　Poster

1P-28　　PDF

Effect of low energy electron ionization (Low Energy EI) with the latest GC/Q-TOF

(Agilent)
Takashi Kasamatsu, Sadao Nakamura, Masahiro Okuda, ^oTakeshi Serino

70 eV electron ionization (EI) commonly used in GC / MS is a hard ionization and it is often difficult to detect molecular ions, therefore sometimes soft ionization is required for yielding the molecular ions. However, in order to perform soft ionization, replacing the ion source is required but it is difficult to perform measurement by soft ionization immediately after switching from 70eV EI analysis. In this study, Low Energy EI measurement was carried out using GC / MS with an ion source that was optimized for conventional energy (70eV) and Low Energy EI, and we examined the effect. This instrument can switch from 70 eV to Low Energy EI only by changing the data acquiring method, so it is very easy to perform Low Energy EI measurement.