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第1日 5月17日(水) 16:05~16:25 C会場(101)

High resolution Kendrick mass defect analysis with fractional base units

(AIST)
oFouquet, ThierrySato, Hiroaki

We introduce the concept of fractional base units as a resolution booster for the Kendrick mass defect (KMD) analysis of polymer ions expected to become a powerful add-on. The variations of KMD values are dramatically amplified if calculated with (repeat unit)/integer in lieu of repeat unit as a base unit. The isotope distributions of a poly(ethylene oxide) (PEO) sample analyzed with a high resolution spiralTOF are turned into a clear KMD plot with several horizontal lines visible at full scale assigned to 12C and 13Cx isotopes using EO/45 instead of EO. The fuzzy EO-based KMD plots of non-ionic surfactants are fully resolved by using EO/43 or EO/45 instead, unequivocally separating all the components. Since the resolution of the KMD analysis step is improved, the resolution of the MS analysis step could be reduced with no loss of information. A KMD analysis is successfully conducted on low resolution mass spectral data of poly(vinyl pyrrolidone) (PVP) recorded with a regular ion trap using VP/112 as the base unit. Similarly, a KMD analysis is done for the first time on high mass range MALDI-MS data of high molecular weight PEO and poly(caprolactone) (PCL) samples up to 20000 Da using EO/43 and CL/113, respectively.