| Date: |
Apr. 21, 2005 |
| Location: |
Hakuto Co., Ltd., Head Office
1-13, Shinjuku 1-Chome, Shinjuku-ku, Tokyo 160-8910
Phone: 03-3225-8910 |
| Registration fee: |
| |
¥3,000 (Student: ¥1,500) |
| Program: |
| 13:00 - 13:05 |
Opening address |
| 13:05 - 13:15 |
Topics of the Workshop |
| 13:15 - 14:45 |
| Yasushi Terui (Hitachi High-Technologies Corp.) |
| |
"Development of a new iontrap-TOF/MS" |
|
| 14:45 - 16:15 |
| Yoshiro Shiokawa (ANELVA Technix Corporation) |
| |
"Recent development of ion attachment mass spectrometry" |
|
| 16:15 - 16:25 |
Intermission |
| 16:25 - 17:55 |
| Shigeo Hayakawa (Associate Professor of Chemistry, Graduate School of Science, Osaka Prefecture University) |
| |
"A new method for structure analysis in mass spectrometry" |
|
| 17:55 - 18:00 |
Closing Session |
| 18:00 - |
Social gathering |
|
| Organizer: |
| |
Makoto Matsumura |
| Chairperson of TMS Division: |
| |
Takahisa Tsugoshi |
| Registration application: |
| |
Yukiko Hirabayashi
E-mail : hiraby@rd.hitachi.co.jp |
